LAboratoire de Spectrochimie Infrarouge et Raman – UMR 8516
random_1
  • Français
  • English
  • Spanish

AFM

The LASIR has acquired a multifunctional atomic force microscope: NTEGRA PRIMA, NT-MDT, for performing the most typical tasks in the field of Scanning Probe Microscopy. It is equipped with an environmental cell that allows studying environmental samples under controlled atmosphere and variable temperature. This device is primarily intended to the analysis of morphological modifications of aerosol particles exposed to conditions that simulate an extended stay in the atmosphere.

Main characteristics of the NTEGRA PRIMA NT-MDT AFM

• Scanning by probe: 100 x 100 x 10 µm3 XYZ scanner with closed loop sensors

Tight environmental cell:
– gas controlled environment: variable temperature (between -5° and + 80°), humidity, reactive gas,
– measurements in temperature controlled liquids

• Scanning by sample : 100 x 100 x 10 µm3 XYZ scanner with closed loop sensors
1 x 1 x 1 µm3 XYZ scanner without feedback

Open cell for measurements in liquids

Modes of use

AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging / Force Modulation (viscoelasticity) / Magnetic Force Microscopy / Electrostatic Force Microscopy/ Adhesion Force Imaging / AFM Lithography-Force /AFM Lithography-Voltage / Spreading Resistance Imaging (SRI) / Scanning Capacitance Imaging (SCI) / Scanning Kelvin probe microscopy (SKM) / Piezo Response Mode (PFM)

Optional extensions:
• STM (Scanning Tunneling Microscopy)
• AFAM (Atomic-Force Acoustic Microscopy)
• TERS (Tip Enhanced Raman Spectroscopy)
• QCM (Quartz Crystal Microbalance)

Atomic steps on NaCl 100